Multi-scale analysis device

专利名称：Multi-scale analysis device发明人：Hidehisa Sakai申请号：US11237936申请日：20050929

公开号：US20070005310A1公开日：20070104

专利附图：

摘要：The distortion of each node is calculated from the distortions of respectiveelements in the finite element analysis result of a global model of a structure, and asecond-order coefficient of a quadratic function representing the displacement at eachnode of a micro model is calculated from distortions of respective nodes. In addition, a

constant term and a first-order coefficient of the quadratic function are calculated fromthe displacements of the respective nodes of the global model. Then, the displacementat each boundary node of the micro model is calculated using the obtained quadraticfunction and a finite element analysis of the micro model is performed.

申请人：Hidehisa Sakai

地址：Kawasaki JP

国籍：JP

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