专利名称：Circuits For And Methods Of Accurately
Measuring Temperature Of SemiconductorJunctions
发明人：Gerd Trampitsch申请号：US13024591申请日：20110210
公开号：US20120207190A1公开日：20120816
专利附图：
摘要：A system for and method of providing a signal proportional to the absolutetemperature of a semiconductor junction is provided. The system comprises: a
preprocessing stage configured and arranged so as to process a signal from thesemiconductor junction so as to produce a preprocessed signal including a resistanceerror term; and a temperature to voltage converter stage for converting the
preprocessed signal to a voltage proportional to absolute temperature representing theabsolute temperature of the semiconductor junction; wherein the system is configuredand arranged so as to remove the resistance error term so as to produce a resistanceerror free signal representative of the semiconductor junction temperature.
申请人：Gerd Trampitsch
地址：Unterfoehring DE
国籍：DE
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