Procedure and device to measure the contours of an

专利名称：Procedure and device to measure the

contours of an object

发明人：MAIER, ANDREAS申请号：EP90110988.4申请日：19900611公开号：EP0403908A2公开日：19901227

专利附图：

摘要：Method and device for measuring, preferably optically scanning, the contoursof an object (11) such as, for example, a rotary chip-forming tool, having at least onecamera (12). The object (11) is turned in a rotating receptacle (9) whose axis of rotation is

located in the longitudinal axis of the object, until the maximum radial dimension isdisplayed in a camera (12) arranged at right angles to the radial adjusting axis of theobject. Computers and VDUs are provided for evaluation.

申请人：HARTMETALLWERKZEUGFABRIK ANDREAS MAIER GMBH + CO KG

地址：STEGWIESEN 2; D-7959 SCHWENDI-HOERENHAUSEN,Stegwiesen 2 D-88477Schwendi DE

国籍：DE

代理机构：König, Beate, Dipl.-Phys. Dr.

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