Failure cause diagnosis system and method

专利名称：Failure cause diagnosis system and method发明人：Hiroki Uchiyama,Shinya Yuda,Hideaki

Suzuki,Kozo Nakamura

申请号：US13578034申请日：20100226公开号：US09122273B2公开日：20150901

专利附图：

摘要：The invention is related to a system and a method to determine whether atarget equipment deviates from a normal state. If it is determined that the targetequipment to be diagnosed deviates from the normal state, the degree of deviation of

each parameter from the normal state as the reference is calculated as an abnormalcontribution ratio. A failure cause is estimated from a similarity ratio between the

calculated abnormal contribution ratio and the abnormal contribution ratio of each of thefailure causes collected in the past and including failure phenomena and failure parts.

申请人：Hiroki Uchiyama,Shinya Yuda,Hideaki Suzuki,Kozo Nakamura

地址：Kawasaki JP,Hitachi JP,Hitachi JP,Hitachiota JP

国籍：JP,JP,JP,JP

代理机构：Baker Botts L.L.P.

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